Sharp Conductive Single Crystal Diamond Probes

Highly conductive Apex Sharp diamond probes, formed by a unique patented process ensure the best possible nanomechanical and electrical performance. These tips are sharper and last longer than any other electrical AFM probe. The conductive diamond coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 – 0.005 Ohm∙cm. Contact resistance is typically 10 kΩ depending on contact radius measured on a silver surface. By using wear-resistant sharp diamond probes the contact size is well characterized and stays constant during mechanical measurements. Quantitative and repeatable measurements for over 24 hours of continuous use have been demonstrated with these probes. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.

Choose among two tip radii and three spring constants to match your application:

– AD-0.5-AS – L=225um, W=50um, k=0.5N.m, f=30kHz, r=10+/-5nm
– AD-2.8-AS – L=225um, W=35um, k=2.8N.m, f=65kHz, r=10+/-5nm
– AD-40-AS – L=225um, W=28um, k=40N.m, f=180kHz, r=10+/-5nm
AD-0.5-SS – L=225um, W=50um, k=0.5N.m, f=30kHz, r<5nm
– AD-2.8-SS – L=225um, W=35um, k=2.8N.m, f=65kHz, r<5nm
– AD-40-SS
– L=225um, W=28um, k=40N.m, f=180kHz, r<5nm

Nanomechanics Probe

These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and can image the indents at high resolution in-situ using the same probe. Each cantilever comes individually characterized with both spring constant and tip radius accurately measured, to enable fully quantitative nanomechanical measurements. Each probe comes with a high-resolution SEM image showing the precise tip shape to enable fully quantitative measurements. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.

·         AD-150-NM – L=125um, W=30um, k=150N/m, f=500kHz, r=10+/-5nm

Introducing Bruker’s New High Resolution PeakForce Tapping Probes for any application, air and fluid!

Bruker AFM Probes presents the world’s first family of probes specifically targeted at delivering the highest resolution images in PeakForce Tapping mode, for any application.  We now offer high resolution PeakForce Tapping probe solutions for:

– Biomolecular lattice imaging (PEAKFORCE-HIRS-F-A)
– Single biomolecule imaging (PEAKFORCE-HIRS-F-B)
– Delicate samples in air and fluid (PEAKFORCE-HIRS-SSB)
– General imaging in air (SCANASYST-AIR-HPI-SS)
– High speed imaging (FASTSCAN-D-SS)

 PEAKFORCE-HIRS-F-A

Delivers highest resolution on molecular lattices.
– k = 0.35 N/m
– f = 165 kHz
– Tip radius = 1 nm
– 10 probes

Lattice structure of Bacteriorhodopsin (bR) taken on an inverted optical microscope with BioScope Resolve.  Inset showing a single particle averaging of the bR trimer.  Green circle showing a single lattice defect.  Blue circle showing the lattice substructures. Z scale 0.6 nm.

 

PEAKFORCE-HIRS-F-B

Delivers highest resolution on single biomolecules.
– k = 0.12 N/m
– f = 100 kHz
– Tip radius = 1 nm
– 10 probes

 
Continuous imaging of the DNA double helix obtained while operating on an inverted optical microscope.  Both the major and minor grooves, 2.2 nm and 1.2 nm respectively, are clearly resolved over the entire DNA strand.  150 nm scan size.  Movie playback speed 9x.

 

PEAKFORCE-HIRS-SSB

Delivers highest resolution on delicate samples in air and fluid.
– k = 0.12 N/m
– f = 100 kHz
– Tip radius = 1 nm
– 10 probes

300 nm image showing carbon nanotubes to be aligned with the crystalline structure of a quartz substrate.  Acquired on a Dimension Icon using PeakForce Tapping, with PEAKFORCE-HIRS-SSB probes.

 

SCANASYST-AIR-HPI-SS

Delivers highest resolution for general imaging in air.
– k = 0.25 N/m
– f = 55 kHz
– Tip radius = 1 nm
– 10 probes

300 nm image resolving sharp ridges on a Nioprobe sample.  Acquired on a Dimension Icon using PeakForce Tapping, with SCANASYST-AIR-HPI-SS probes.

 

FASTSCAN-D-SS

Delivers highest resolution for high speed imaging.
– k = 0.25 N/m
– f = 110 kHz (fluid)
– Tip radius = 1 nm
– 10 probes

2

Bruker AFM Probes presents the world’s first family of probes specifically targeted at delivering the highest resolution on bio-samples.  From individually isolated biomolecules to 2D moecular lattices, Bruker now offers a PeakForce-HiRs fluid probe to suit your high resolution needs.

Delivers highest resolution on molecular lattices.
– k = 0.35 N/m
– Tip radius = 1 nm
– 10 probes

Lattice structure of Bacteriorhodopsin (bR) taken on an inverted optical microscope with BioScope Resolve.  Inset showing a single particle averaging of the bR trimer.  Green circle showing a single lattice defect.  Blue circle showing the lattice substructures. Z scale 0.6 nm.

 

Delivers highest resolution on single biomolecules.
– k = 0.12 N/m
– Tip radius = 1 nm
– 10 probes

 
Continuous imaging of the DNA double helix obtained while operating on an inverted optical microscope.  Both the major and minor grooves, 2.2 nm and 1.2 nm respectively, are clearly resolved over the entire DNA strand.  150 nm scan size.  Movie playback speed 9x.

 

December 9, 2015

Dear Valued Contact,

Thank you for your business and engagement with Bruker this past year. We want to call your attention to some important changes in our email addresses for 2016.

Effective January 1, 2016 Bruker email addresses with extension “@bruker-nano.com” will no longer be active.

Our new email extensions “@bruker.com” are active immediately.

Please make note of these changes in your files and correspondence. We will not be able to receive or respond to emails directed to the old addresses.
Below is a chart to assist in identifying the new email addresses.table2Feel free to contact us with any questions.

Best regards,
Bruker Nano Surfaces

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PeakForce Tapping – Introduction

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Thursday, 6 August 2015 Comments (0)  

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