Surface Potential Microscopy – SPoM
Wednesday, 1 June 2011
Surface Potential Microscopy (SPoM) is based on the macroscopic Kelvin method. SPoM is able to measure surface topography and surface potential (VDC) information simultaneously. Topography is acquired using TappingMode™ operation but with a conductive tip. The electrical information is extracted by applying AC and DC voltages to the tip. The total voltage acting on the tip is: V = VDC + VAC sin (Ω t). A dedicated feedback loop adjusts the DC voltage to the tip to zero the contact potential difference between the tip and surface at each pixel, making DC a measure of the surface potential. SPoM can be carried out using LiftMode™ or in a dual-frequency one-pass fashion.
Probes:
- –SCM-PIT-V2
- –MESP & MESP-V2
- –MFMV