Bruker

+1 (800) 715-8440

Bruker AFM Probes Announcements » SPM & AFM Modes » Scanning Thermal Microscopy

Scanning Thermal Microscopy

In Scanning Thermal Microscopy (SThM) a heated tip is scanned across a sample. Changes in the tip’s resistivity reveal either thermal conductivity or thermal gradients on the sample. In Nanoscale Analysis (NA), a tip is heated in such a way that it induces a phase transition in the sample. That transition is monitored using the cantilever deflection and is material specific.

Probes: