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Bruker AFM Probes Announcements » SPM & AFM Modes » Scanning Spreading Resistance Microscopy – SSRM

Scanning Spreading Resistance Microscopy – SSRM

SSRM uses contact mode AFM and a conductive probe. Sensor Signal is the electric current between the tip and sample for an applied DC bias, VDC. SSRM measures the current by referencing it to an internal resistor, using a logarithmic amplifier, to yield local resistance value. SSRM maps the variation in majority carrier concentration in doped
semiconductors.

 

Probes: