Electrostatic Force Microscopy (EFM) uses a combination of TappingMode™, LiftMode™and a conductive tip to gather information about the electric field above a sample. Each line of the sample is first scanned in TappingMode operation to obtain the sample topography. The topographic information is stored and retraced with a user- selectable height offset in LiftMode, during which the electrical data is collected. Typical lift heights in EFM range from 20-80 nm.

Probes: