This webinar is presented by Dr. Francesca Toma and Dr. Johanna Eichhorn from Lawrence Berkeley National Laboratory (LBNL). They are pioneers in characterizing charge carrier transport in energy materials by pc-AFM.
In this webinar, Dr. Francesca Toma will give a short overview of the ongoing research projects on solar energy conversion in her group. Dr. Johanna Eichhorn will then focus on the nanoscale characterization of BiVO4 – a highly interesting semiconductor light absorber for solar water splitting. Toma and Eichhorn recently performed quantitative analysis of sub-pA photocurrent maps and IV-curves obtained with their Dimension Icon AFM. Specifically, they revealed the critical impact of (i) contact formation between the nanoscale probe and the semiconductor, and of (ii) chemical environment on nanoscale transport measurements of PEC devices. For the first time, they showed that the charge transport in BiVO4 photoanodes can be described by the space-charge-limited current model in the presence of trap states. Furthermore, they used complementary pc-AFM and in-situ Kelvin probe measurements to elucidate the influence of chemical interactions of adsorbed oxygen and water on charge transport and interfacial charge transfer of photogenerated charge carriers. Their research revealed that surface-adsorbed oxygen acts as a shallow trap state limiting electronic performance of BiVO4 thin films. Learn more and register.

SANTA BARBARA, California – November 28, 2018 – Bruker today announced the release of the Dimension XR™ family of scanning probe microscopes (SPMs). These new systems incorporate major AFM innovations, including Bruker’s proprietary and exclusive DataCube nanoelectrical modes, AFM-SECM for energy research, and the new AFM-nDMA mode, which for the first time correlates polymer nanomechanics to bulk dynamic mechanical analysis (DMA). Building on two of the world’s most utilized AFM platforms in scientific publications, the Icon® and FastScan®Dimension XR SPMs are available in three configurations optimized for nanomechanics, nanoelectrical, and nanoelectrochemical applications. These systems significantly expand researchers’ ability to quantify material properties at the nanoscale in air, fluids, electrical, and chemically reactive environments.

“The new Dimension XR systems are the culmination of years of innovations to provide quantitative and easy-to-use nanomechanical, nanoelectrical, and nanoelectrochemical characterization,” explained David V. Rossi, Executive Vice President and General Manager of Bruker’s AFM business. “Our goal is to make these first and only capabilities widely available to the research community, enabling their breakthrough AFM discoveries with new nanoscale information.”

Learn more.

Providing First and Only AFM Viscoelastic Measurements that Match Bulk DMA

BOSTON, Massachusetts – November 27, 2018 – At the 2018 MRS Fall Meeting & Exhibit, Bruker today announced the release of the AFM-nDMA™ mode for Dimension® atomic force microscopes (AFMs). Going beyond the quantitative elastic modulus mapping enabled by Bruker’s exclusive PeakForce QNM® mode, AFM-nDMA provides first and only nanoscale viscoelastic measurements that match bulk dynamic mechanical analysis (DMA) over the entire frequency range typical in bulk rheological measurements. Enabled by proprietary algorithms, AFM-nDMA works directly at rheological frequencies, quantifies preload and adhesion, and comes with absolute calibration. As a result, AFM-nDMA generates entire master curves of storage modulus, loss modulus, and loss tangent, including analysis for activation energy, thus vastly expanding the AFM market by providing polymer rheology at the nanoscale.

“Bruker’s AFM-nDMA is the first commercial solution for quantifying viscoelasticity at the spatial scales of AFM,” said Dr. Ken Nakajima, Professor of Polymer Physics at Tokyo Institute of Technology. “Having pioneered nanoscale rheological measurements, I am very excited to see this important capability become widely available.”

“We can now quantify local viscoelasticity at relevant frequencies and length scales that relate nanoscale properties to bulk performance,” added Greg Meyers, Ph.D., Dow Chemical Core R&D Fellow. “This addresses a significant unmet need for industrial polymer characterization.”

AFM-nDMA reflects our long-standing commitment to provide quantitative and easy-to-use nanomechanical characterization,” explained David V. Rossi, Executive Vice President and General Manager of Bruker’s AFM business. “From the invention of TappingModeTM to PeakForce Tapping® and now AFM-nDMA, we have consistently led this charge, and we are very eager to see the use of atomic force microscopy growing with quantitative viscoelastic characterization.”

Learn more.

October 25, 2018 ─ Bruker has recently introduced new and expanded probe families to address AFM industry needs.

PeakForce Deep Trench

Bruker’s new PeakForce Deep Trench (PFDT) series of probes is engineered to provide accurate depth metrology and imaging on the most challenging structures encountered on semiconductor samples and optics, including trenches and pits with aggressive aspect ratios and depths of more than 100nm.

Specifically designed for Dimension Icon, this probe series leverages PeakForce Tapping technology. PeakForce is well known to be ideal for aggressive geometries, such as deep and narrow trenches, because it avoids the air damping and sticking effects that plague approaches based on resonant modes such as Tapping or non-contact. The cantilever shape, spring constant, and resonance frequency of these probes are highly optimized for PeakForce Tapping, and the spike angle is tilt corrected for Dimension Icon. The result is repeatable, accurate metrology with high throughput and long tip life.

Contact Resonance

Bruker is also introducing a range of probes for contact resonance. All of these probes feature a wear-resistant, conductive diamond coating for highest repeatability and resolution. On a Dimension Icon with FASTForce Volume Contact Resonance, these probes have been shown to provide many dozens of images with no measurable wear or change in nanomechanical values. These probes also employ Bruker’s V2 process for the most consistent tip and cantilever shape, further enhancing measurement consistency.


We have vastly expanded our offering of Adama Innovations diamond probes. Our range now includes sharp and supersharp apex diamond tips for high resolution electrical applications, intermediate radius cone shape tips with outstanding consistency, wide angle tips for highest load mechanical applications, and high aspect ratio pillar tips for the most challenging geometries. All tips feature strong wear resistance, allowing for constant contact size and resolution during long term measurements.


Expands Life Science Microscopy Portfolio and Adds Mechano-Biology Measurements

BILLERICA, Massachusetts, July 12, 2018 ─ Bruker Corporation today announced that it has acquired JPK Instruments AG (JPK), located in Berlin, Germany. In 2017, JPK Instruments had revenue of approximately 10 million Euro. JPK provides microscopy instrumentation for biomolecular and cellular imaging, as well as force measurements on single molecules, cells and tissues. JPK adds in-depth expertise in live-cell imaging, cellular mechanics, adhesion, and molecular force measurements, optical trapping, and biological stimulus-response characterization to Bruker. Financial details of the transaction were not disclosed.

Over the past five years, Bruker has developed a life science microscopy business that specializes in advanced technologies for neuroscience, live-cell imaging, and molecular imaging, which will be further augmented by JPK’s advanced technologies and applications. Bruker’s existing fluorescence microscopy techniques include performance-leading multiphoton microscopy, swept-field confocal microscopy, super-resolution microscopy, and single-plane illumination microscopy.

“We have been making a substantial investment in advanced technologies for life science imaging, and have built up a portfolio of fluorescence microscopy products that enable biologists in research areas that require deep, fast imaging at high resolution and at low phototoxicity,” commented Dr. Mark R. Munch, President of the Bruker NANO Group. “JPK’s products and applications capabilities nicely augment our current techniques.”

Anthony Finbow, Chairman at JPK, added: “The combination of these two businesses will enable further significant advances in life science imaging and drive the state of the industry. I am delighted that we have been able to achieve this result for JPK and for Bruker.”

“The business we have built aligns well with the new strategic direction of Bruker in life science microscopy, and we are very pleased to join them,” said Dr. Torsten Jaehnke, a JPK founder and CTO. “We plan to realize a number of valuable synergies going forward.”

JPK’s BioAFM and optical tweezer product families span a range of techniques, from imaging of biological samples to characterizing biomolecular and cellular force interactions. Its NanoWizard 4 BioScience AFM combines atomic force imaging with advanced optical fluorescence imaging and super-resolution microscopy for the ultimate combination in image resolution for molecules, membranes, and live cells. In addition, the ForceRobot enables single-molecule force spectroscopy for investigating receptor-ligand interactions or small molecule-protein binding interactions. The CellHesion product brings quantitative force measurement to live cells and tissues, enabling insights in cell-substrate and cell-cell interactions. Lastly, JPK’s NanoTracker optical tweezer provides an all-optical means for molecular and cellular force experiments.

JPK’s offerings and life science applications expertise are synergistic with Bruker’s existing portfolio of advanced fluorescence microscopy products. Bruker’s Ultima family of multiphoton microscopes features proprietary photoactivation and photostimulation capabilities and deeper penetration into biological tissues, enabling advanced brain slice and intra-vital studies. Bruker’s Opterra swept-field scanning confocal fluorescence microscope provides unique live-cell imaging capabilities with unsurpassed dynamic observation of fast cellular events. Additionally, the Vutara super-resolution single-molecule localization (SML) microscope utilizes patented Biplane Imaging technology to provide high-speed, 3D super resolution for multicolor live-cell imaging and visualization of chromosome conformation. With a leading series of single plane illumination products, such as the MuVi SPIM and InVi SPIM, Bruker offers unique performance and easiest-to-use light sheet instruments featuring the combination of low phototoxicity and high-speed imaging. The combined microscopy portfolio of the two companies will enable a unique range of correlative measurements for emerging life science applications.

About Bruker Corporation (NASDAQ: BRKR)

Bruker is enabling scientists to make breakthrough discoveries and develop new applications that improve the quality of human life. Bruker’s high-performance scientific instruments and high-value analytical and diagnostic solutions enable scientists to explore life and materials at molecular, cellular and microscopic levels. In close cooperation with our customers, Bruker is enabling innovation, improved productivity and customer success in life science molecular research, in applied and pharma applications, in microscopy and nanoanalysis, and in industrial applications, as well as in cell biology, preclinical imaging, clinical phenomics and proteomics research and clinical microbiology.

Investor Contact:
Miroslava Minkova
Director, Investor Relations & Corporate Development
T: +1 (978) 663-3660 x1479

Media Contact:
Stephen Hopkins
Bruker Nano Surfaces Content Marketing Manager
T: +1 (520) 741-1044 x1022

Infrared Spectroscopy Technology Adds to Bruker’s NanoScale Measurement Portfolio

BILLERICA, Massachusetts, April 17, 2018 ─ Bruker today announced that it has acquired Anasys Instruments Corp., a privately held company that develops and manufactures nanoscale infrared spectroscopy and thermal measurement instruments. This acquisition adds to Bruker’s portfolio of Raman and FTIR spectrometers, as well as to its nanoscale surface science instruments, such as atomic force microscopy and white-light interferometric 3D microscopy. Financial details of the transaction were not disclosed.

Headquartered in Santa Barbara, California, Anasys Instruments Corp. has pioneered the field of nanoprobe-based thermal and infrared measurements. Its industry-leading nanoIR™ products are used by premier academic and industrial scientists and engineers in soft-matter and hard-matter materials science, and in life science applications. Recently Anasys introduced even higher performance with 10 nanometer resolution nanoIR imaging.

“We are very excited to add this strategic, high-growth area to our portfolio of nanoscale microscopy and spectroscopy measurement products,” said Dr. Mark R. Munch, President of the Bruker NANO Group. “There are tremendous application and technology synergies that will benefit our customers.”

“We are very happy to have found a company like Bruker to take the business to the next level,” added Roshan Shetty, co-founder and former CEO of Anasys. “We feel that Bruker’s history in innovative instrument research, and Bruker’s global reach will build on our own history of unique and pioneering achievements in thermal and nanoIR measurements.”

About Anasys Instruments Corp.

Anasys Instruments is the world leader in photothermal IR spectroscopy from the nanoscale to the sub-micron and macro scales. We are dedicated to delivering innovative products and solutions that measure spatially varying physical and chemical properties with nanoscale spatial resolution in a diverse range of fields, including polymers, 2D materials, materials science, life science and micro-electronics industry. Our goal is to provide productive solutions that help researchers clear the path to their next discovery and help industrial companies to solve critical process problems.

About Bruker Corporation

For more than 55 years, Bruker has enabled scientists to make breakthrough discoveries and develop new applications that improve the quality of human life. Bruker’s high-performance scientific instruments and high-value analytical and diagnostic solutions enable scientists to explore life and materials at molecular, cellular and microscopic levels.

In close cooperation with our customers, Bruker is enabling innovation, productivity and customer success in life science molecular research, in applied and pharma applications, and in microscopy, nano-analysis and industrial applications. In recent years, Bruker has also become a provider of high-performance systems for cell biology, preclinical imaging, clinical phenomics and proteomics research, clinical microbiology, and for molecular pathology research. For more information, please visit:

Investor Contact: 
Miroslava Minkova
Bruker Head of Investor Relations
3400 East Britannia Drive, Suite 150, Tucson, AZ 85706
T: +1 (978) 663-3660 x1479

Media Contact: 
Stephen Hopkins
Bruker Nano Surfaces MarCom Supervisor
T: +1 (520) 741-1044 x1022

Introducing Bruker’s new MLCT-BIO and MLCT-BIO-DC probes

Optimized probes for lowest forces in BioAFM imaging and force spectroscopy.

Bruker’s new line of MLCT-BIO and MLCT-BIO-DC probes address a range of BioAFM applications, particularly for live cell imaging and force spectroscopy with:

  • Low spring constants down to 0.01N/m for contact mode and bio force spectroscopy
  • Tip radius and apex angle avoids damage on live cells
  • Nitride tip material suitable for bio adhesion / functionalization studies
  • Biocompatible backside gold coating minimizes interference
  • Tight bend specification ensures wide compatibility with AFMs
  • MLCT-BIO-DC adds unique drift compensation on all levers

The added drift compensation on MLCT-BIO-DC enables maintaining low, constant forces in both, contact mode imaging and ramp-hold experiments where force drift often effectively limits the ability to probe cell viscoelasticity.

  • MLCT-BIO six levers/chip with k from 0.01N/m to 0.6N/m, 10-pack
  • MLCT-BIO-DC six levers/chip with k from 0.01N/m to 0.6N/m, , drift compensated, 10-pack

Probes for Quantitative Modulus Mapping with Dimension Icon

Introducing Bruker’s line of individually precalibrated probes for quantitative nanomechanical mapping with Dimension Icon. These probes address the dominant sources of errors in nanomechanics mapping by providing a controlled 30nm end radius and individually LDV (Laser Dopper Vibrometer) calibrated spring constants. Individual probe parameters are embedded in a QR code for fast and error free transfer into Bruker v9.4 NanoScope real-time software with the QR reader included in the new Bruker PeakForce QNM high accuracy kits.

Choose among a range of spring constants from 0.25 N/m to 200 N/m to address your application:

Sharp Conductive Single Crystal Diamond Probes

Highly conductive Apex Sharp diamond probes, formed by a unique patented process ensure the best possible nanomechanical and electrical performance. These tips are sharper and last longer than any other electrical AFM probe. The conductive diamond coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 – 0.005 Ohm∙cm. Contact resistance is typically 10 kΩ depending on contact radius measured on a silver surface. By using wear-resistant sharp diamond probes the contact size is well characterized and stays constant during mechanical measurements. Quantitative and repeatable measurements for over 24 hours of continuous use have been demonstrated with these probes. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.

Choose among two tip radii and three spring constants to match your application:

– AD-0.5-AS – L=225um, W=50um, k=0.5N.m, f=30kHz, r=10+/-5nm
– AD-2.8-AS – L=225um, W=35um, k=2.8N.m, f=65kHz, r=10+/-5nm
– AD-40-AS – L=225um, W=28um, k=40N.m, f=180kHz, r=10+/-5nm
AD-0.5-SS – L=225um, W=50um, k=0.5N.m, f=30kHz, r<5nm
– AD-2.8-SS – L=225um, W=35um, k=2.8N.m, f=65kHz, r<5nm
– AD-40-SS
– L=225um, W=28um, k=40N.m, f=180kHz, r<5nm

Nanomechanics Probe

These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and can image the indents at high resolution in-situ using the same probe. Each cantilever comes individually characterized with both spring constant and tip radius accurately measured, to enable fully quantitative nanomechanical measurements. Each probe comes with a high-resolution SEM image showing the precise tip shape to enable fully quantitative measurements. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.

·         AD-150-NM – L=125um, W=30um, k=150N/m, f=500kHz, r=10+/-5nm

Introducing Bruker’s New High Resolution PeakForce Tapping Probes for any application, air and fluid!

Bruker AFM Probes presents the world’s first family of probes specifically targeted at delivering the highest resolution images in PeakForce Tapping mode, for any application.  We now offer high resolution PeakForce Tapping probe solutions for:

– Biomolecular lattice imaging (PEAKFORCE-HIRS-F-A)
– Single biomolecule imaging (PEAKFORCE-HIRS-F-B)
– Delicate samples in air and fluid (PEAKFORCE-HIRS-SSB)
– General imaging in air (SCANASYST-AIR-HPI-SS)
– High speed imaging (FASTSCAN-D-SS)


Delivers highest resolution on molecular lattices.
– k = 0.35 N/m
– f = 165 kHz
– Tip radius = 1 nm
– 10 probes

Lattice structure of Bacteriorhodopsin (bR) taken on an inverted optical microscope with BioScope Resolve.  Inset showing a single particle averaging of the bR trimer.  Green circle showing a single lattice defect.  Blue circle showing the lattice substructures. Z scale 0.6 nm.



Delivers highest resolution on single biomolecules.
– k = 0.12 N/m
– f = 100 kHz
– Tip radius = 1 nm
– 10 probes

Continuous imaging of the DNA double helix obtained while operating on an inverted optical microscope.  Both the major and minor grooves, 2.2 nm and 1.2 nm respectively, are clearly resolved over the entire DNA strand.  150 nm scan size.  Movie playback speed 9x.



Delivers highest resolution on delicate samples in air and fluid.
– k = 0.12 N/m
– f = 100 kHz
– Tip radius = 1 nm
– 10 probes

300 nm image showing carbon nanotubes to be aligned with the crystalline structure of a quartz substrate.  Acquired on a Dimension Icon using PeakForce Tapping, with PEAKFORCE-HIRS-SSB probes.



Delivers highest resolution for general imaging in air.
– k = 0.25 N/m
– f = 55 kHz
– Tip radius = 1 nm
– 10 probes

300 nm image resolving sharp ridges on a Nioprobe sample.  Acquired on a Dimension Icon using PeakForce Tapping, with SCANASYST-AIR-HPI-SS probes.



Delivers highest resolution for high speed imaging.
– k = 0.25 N/m
– f = 110 kHz (fluid)
– Tip radius = 1 nm
– 10 probes