This webinar is presented by Dr. Francesca Toma and Dr. Johanna Eichhorn from Lawrence Berkeley National Laboratory (LBNL). They are pioneers in characterizing charge carrier transport in energy materials by pc-AFM.
In this webinar, Dr. Francesca Toma will give a short overview of the ongoing research projects on solar energy conversion in her group. Dr. Johanna Eichhorn will then focus on the nanoscale characterization of BiVO4 – a highly interesting semiconductor light absorber for solar water splitting. Toma and Eichhorn recently performed quantitative analysis of sub-pA photocurrent maps and IV-curves obtained with their Dimension Icon AFM. Specifically, they revealed the critical impact of (i) contact formation between the nanoscale probe and the semiconductor, and of (ii) chemical environment on nanoscale transport measurements of PEC devices. For the first time, they showed that the charge transport in BiVO4 photoanodes can be described by the space-charge-limited current model in the presence of trap states. Furthermore, they used complementary pc-AFM and in-situ Kelvin probe measurements to elucidate the influence of chemical interactions of adsorbed oxygen and water on charge transport and interfacial charge transfer of photogenerated charge carriers. Their research revealed that surface-adsorbed oxygen acts as a shallow trap state limiting electronic performance of BiVO4 thin films. Learn more and register.

SANTA BARBARA, California – November 28, 2018 – Bruker today announced the release of the Dimension XR™ family of scanning probe microscopes (SPMs). These new systems incorporate major AFM innovations, including Bruker’s proprietary and exclusive DataCube nanoelectrical modes, AFM-SECM for energy research, and the new AFM-nDMA mode, which for the first time correlates polymer nanomechanics to bulk dynamic mechanical analysis (DMA). Building on two of the world’s most utilized AFM platforms in scientific publications, the Icon® and FastScan®Dimension XR SPMs are available in three configurations optimized for nanomechanics, nanoelectrical, and nanoelectrochemical applications. These systems significantly expand researchers’ ability to quantify material properties at the nanoscale in air, fluids, electrical, and chemically reactive environments.

“The new Dimension XR systems are the culmination of years of innovations to provide quantitative and easy-to-use nanomechanical, nanoelectrical, and nanoelectrochemical characterization,” explained David V. Rossi, Executive Vice President and General Manager of Bruker’s AFM business. “Our goal is to make these first and only capabilities widely available to the research community, enabling their breakthrough AFM discoveries with new nanoscale information.”

Learn more.

Providing First and Only AFM Viscoelastic Measurements that Match Bulk DMA

BOSTON, Massachusetts – November 27, 2018 – At the 2018 MRS Fall Meeting & Exhibit, Bruker today announced the release of the AFM-nDMA™ mode for Dimension® atomic force microscopes (AFMs). Going beyond the quantitative elastic modulus mapping enabled by Bruker’s exclusive PeakForce QNM® mode, AFM-nDMA provides first and only nanoscale viscoelastic measurements that match bulk dynamic mechanical analysis (DMA) over the entire frequency range typical in bulk rheological measurements. Enabled by proprietary algorithms, AFM-nDMA works directly at rheological frequencies, quantifies preload and adhesion, and comes with absolute calibration. As a result, AFM-nDMA generates entire master curves of storage modulus, loss modulus, and loss tangent, including analysis for activation energy, thus vastly expanding the AFM market by providing polymer rheology at the nanoscale.

“Bruker’s AFM-nDMA is the first commercial solution for quantifying viscoelasticity at the spatial scales of AFM,” said Dr. Ken Nakajima, Professor of Polymer Physics at Tokyo Institute of Technology. “Having pioneered nanoscale rheological measurements, I am very excited to see this important capability become widely available.”

“We can now quantify local viscoelasticity at relevant frequencies and length scales that relate nanoscale properties to bulk performance,” added Greg Meyers, Ph.D., Dow Chemical Core R&D Fellow. “This addresses a significant unmet need for industrial polymer characterization.”

AFM-nDMA reflects our long-standing commitment to provide quantitative and easy-to-use nanomechanical characterization,” explained David V. Rossi, Executive Vice President and General Manager of Bruker’s AFM business. “From the invention of TappingModeTM to PeakForce Tapping® and now AFM-nDMA, we have consistently led this charge, and we are very eager to see the use of atomic force microscopy growing with quantitative viscoelastic characterization.”

Learn more.

October 25, 2018 ─ Bruker has recently introduced new and expanded probe families to address AFM industry needs.

PeakForce Deep Trench

Bruker’s new PeakForce Deep Trench (PFDT) series of probes is engineered to provide accurate depth metrology and imaging on the most challenging structures encountered on semiconductor samples and optics, including trenches and pits with aggressive aspect ratios and depths of more than 100nm.

Specifically designed for Dimension Icon, this probe series leverages PeakForce Tapping technology. PeakForce is well known to be ideal for aggressive geometries, such as deep and narrow trenches, because it avoids the air damping and sticking effects that plague approaches based on resonant modes such as Tapping or non-contact. The cantilever shape, spring constant, and resonance frequency of these probes are highly optimized for PeakForce Tapping, and the spike angle is tilt corrected for Dimension Icon. The result is repeatable, accurate metrology with high throughput and long tip life.

Contact Resonance

Bruker is also introducing a range of probes for contact resonance. All of these probes feature a wear-resistant, conductive diamond coating for highest repeatability and resolution. On a Dimension Icon with FASTForce Volume Contact Resonance, these probes have been shown to provide many dozens of images with no measurable wear or change in nanomechanical values. These probes also employ Bruker’s V2 process for the most consistent tip and cantilever shape, further enhancing measurement consistency.

Adama

We have vastly expanded our offering of Adama Innovations diamond probes. Our range now includes sharp and supersharp apex diamond tips for high resolution electrical applications, intermediate radius cone shape tips with outstanding consistency, wide angle tips for highest load mechanical applications, and high aspect ratio pillar tips for the most challenging geometries. All tips feature strong wear resistance, allowing for constant contact size and resolution during long term measurements.

 

Featuring PeakForce Tapping for Quantitative Bio-Mechanical Property Mapping

 

SAN Diego, California – December 15, 2014 – At the Sixth AFM BioMed Conference, Bruker (NASDAQ: BRKR) today announced the release of BioScope Resolve™, a biological atomic force microscope (bioAFM) that features the highest resolution imaging and most complete cell mechanics capabilities available for use with an inverted optical microscope (IOM). The system incorporates Bruker’s proprietary PeakForce Tapping® technology to enable researchers to achieve both the highest resolution imaging and piconewton level force measurements on biological samples. BioScope Resolve also provides real-time correlation of atomic force microscopy and optical microscopy data sets to provide unique insights into life sciences research. Ultimately, BioScope Resolve enables imaging and mechanical property mapping of the biological detail of cells, tissues, and biomolecular structures never previously observed with a bioAFM on an IOM.

“For the first time bioAFM analysis can directly correlate high-resolution molecular structures with function on the same cell,” said Dr. Lewis Francis of the College of Medicine and Center of NanoHealth at Swansea University, United Kingdom. “BioScope Resolveprovides the dynamic range and resolution necessary to allow a deeper understanding of structure-function relationships at cell and tissue surfaces.”

BioScope Resolve establishes a new benchmark for high-resolution imaging and cell mechanics characterization capabilities that are fully integrated with optical microscopy,” added David V. Rossi, Executive Vice President and General Manager of Bruker’s AFM business. “It builds upon our exclusive and leading PeakForce Tapping technology to enable the highest performance bioAFM that researchers of every experience level will find very easy to use.”

“PeakForce Tapping provided my lab with the force control and resolution necessary to produce ground-breaking ligand-receptor interaction maps using functionalized probes on live cells in a very time efficient and controlled way,” commented Professor Dr. Daniel Muller of the Department of Biosystems Science and Engineering at the ETH Zürich, Switzerland, about his experience using PeakForce Tapping.

About BioScope Resolve

BioScope Resolve is an AFM developed specifically for integration with optical microscopy for biological research into cells, tissues and molecules. The new system provides the most complete range of capabilities for cell mechanics and molecular force spectroscopy. Its design enables the highest resolution imaging for all types of biological samples, from cells to biomolecules, making it the new benchmark in high-resolution bioAFM capability. In addition, BioScope Resolve has complete synchronization with the top inverted optical microscope brands, and provides single-button imaging using proprietary ScanAsyst® technology. Researchers can utilize the system’s quantitative PeakForce QNM® nanomechanics package to map the surfaces of soft biological samples. BioScope Resolve’smechanical mapping capabilities bridge Force Volume and PeakForce QNM frequencies for the widest range available for force-distance curves on any AFM. BioScope Resolve also offers a full array of accessories to preserve the integrity of delicate samples, including carrier support with clear visual and physical access to samples, environmental control with heating and cooling capabilities, and a wide range of pre-calibrated biological probes.

About Bruker Corporation

Bruker Corporation is a leading provider of high-performance scientific instruments and solutions for molecular, cellular and materials research, as well as for industrial, diagnostics, clinical research and applied analysis.

Media Contact: 
Stephen Hopkins, Marketing Communications
Bruker Nano Surfaces Division
3400 East Britannia Drive, Suite 150, Tucson, AZ 85706
T: +1 (520) 741-1044 x1022
E: steve.hopkins@bruker-nano.com

Investor Contact: 
Joshua Young
Vice President, Investor Relations
T: +1 (978) 663-3660 x1479
E: Joshua.young@bruker.com

World-Leading Graphene Research Facility Purchases Multiple Bruker AFMs

 

BILLERICA, Mass. – April 6, 2015 – Bruker Corporation (NASDAQ: BRKR) today announced an official partnership with the University of Manchester’s National Graphene Institute (NGI), joining a select list of industrial collaborators. This partnership follows NGI’s purchase of two additional atomic force microscopes (AFMs) from Bruker, a Dimension FastScan® and a Dimension Icon®. These systems join five other Bruker AFMs at the facility for research into the nanofabrication and nanoscale properties of graphene. As part of this partnership, Bruker will partially sponsor a Ph.D. student working on novel scanning probe microscopy (SPM) techniques to characterize graphene and 2D materials.

 

Graphene, the world’s thinnest, strongest and most conductive material, was first isolated and characterized at The University of Manchester by Sir Andre Geim and Sir Kostya Novoselov, who were awarded the Nobel Prize for Physics in 2010 for their research. This transparent, one-atom thick flat sheet of carbon has the potential to revolutionize technology, from smartphones and ultrafast broadband to drug delivery and computer chips. AFMs have demonstrated spatial resolution of less than a nanometer, and enable scientists developing materials such as graphene to understand critical mechanical, electrical, and chemical properties at the atomic scale.

 

“Our Bruker AFMs are anticipated to provide important new insights into nanoscale variations of graphene conductivity and work function,” said Nobel Prize winner Professor Novoselov. “Coupled with simultaneous quantitative mapping of mechanical properties, enabled by Bruker’s exclusive PeakForce Tapping®, NGI researchers hope to uncover new information that will ultimately optimize the performance of graphene-based materials and devices.”

 

“We are pleased that the National Graphene Institute continues to rely on our proprietary technology for its new world-class research facility, bringing their total now to seven Bruker systems,” added Paul Scagnetti, Ph.D., President of Bruker’s Nano Surfaces Division. He continued: “We are also gratified to be a part of the UK-wide Centre for Doctoral Training, where our unique AFM technologies will enable the sponsored Ph.D. student to learn even more about the physical and electrical properties of 2D materials under Professor Novoselov.”

 

About the UK National Graphene Institute 
The National Graphene Institute at The University of Manchester, UK, opened in March 2015, creating around 100 new jobs in a new, 7,800 square meter facility that will house state-of-the-art facilities, including two cleanrooms. The Institute will also feature a 1,500 square meter research lab for University of Manchester graphene scientists to collaborate with their colleagues from industry and other universities.

 

About Bruker Corporation 
For more than 50 years, Bruker has enabled scientists to make breakthrough discoveries and develop new applications that improve the quality of human life. Bruker’s high-performance scientific research instruments and high-value analytical solutions enable scientists to explore life and materials at molecular, cellular and microscopic levels.

 

In close cooperation with our customers, Bruker is enabling innovation, productivity and customer success in life science molecular research, in applied and pharma applications, in microscopy, nano-analysis and industrial applications, as well as in cell biology, preclinical imaging, clinical research, microbiology and molecular diagnostics.

 

Media Contact: 
Stephen Hopkins, Marketing Communications
Bruker Nano Surfaces Division
T: +1 (520) 741-1044 x1022
E: steve.hopkins@bruker-nano.com

 

Investor Contact: 
Joshua Young
Vice President, Investor Relations
T: +1 (978) 663-3660 x1479
E: Joshua.young@bruker.com

SANTA BARBARA, California, September 30, 2014 – In a just released article in the Journal of Molecular Recognition, Dr. Hermann Schillers et al. report the first visualization of individual microvilli on living cells with atomic force microscopy. Microvilli are soft, microscopic cellular membrane protrusions present on epithelial cells that act to increase available surface area, enhance transmembrane transport, and serve as mechanosensors. Changes in their density and morphology are associated with diseases, such as celiac disease. As noted by Dr. Schillers, direct observation of microvilli on live cells had long eluded the AFM community.

“It was previously impossible to resolve the finest structures of a live cell like microvilli, but now with the BioScope Resolve, I can image them easily in one hour,” noted Dr. Schillers, lead author of the article. “This opens up exciting opportunities for new studies. Observing the structural and therefore functional integrity of microvilli on living cells will help to understand the development of microvilli-dependent diseases.”

Conventional AFMs subject live cells to high normal and lateral forces, yielding images that are dominated by the structure of the harder, underlying cytoskeleton and thus limiting their ability to track any changes in situ on the membrane of live cells. Bruker’s BioScope Resolve™ overcomes this challenge by probing the cell membrane at lower forces and with less spatial averaging from the extended probe structure and its movement through the viscous medium, bringing soft cell membrane structures into clear view for the first time.

About BioScope Resolve BioScope 
Resolve is an AFM designed specifically for the highest resolution imaging of all biological samples while on the inverted optical microscope. BioScope Resolve is the only AFM to resolve individual microvilli on live cells. It provides the most complete range of capabilities for cell mechanics and molecular force spectroscopy. Its exclusive PeakForce QNM® and FastForce Volume™ techniques deliver the highest resolution and fastest force mapping capabilities possible with an AFM and the widest range of force distance ramp rates. In addition, BioScope Resolve offers complete synchronization of AFM imaging and force spectroscopy with optical microscopy techniques, enabling new kinds of correlated experiments. BioScope Resolve is available with a full array of accessories including temperature and environmental control for live-cell imaging. For more information about Bruker’s BioAFM systems, please visit www.bruker.com/bioafm.

Media Contact: 
Stephen Hopkins, Marketing Communications
T: +1 (520) 741-1044 x1022
E: steve.hopkins@bruker.com

SANTA BARBARA, California – January 12, 2016 – Bruker’s Nano Surfaces Division today announced the release of the MultiMode 8-HR Atomic Force Microscope (AFM), which brings extensive new capabilities for nanomechanics and higher speed imaging to the world’s highest resolution, most widely-used and field-proven scanning probe microscope (SPM). The new nanomechanics features of MultiMode 8-HR enable researchers to access the broadest range of ramp frequencies for viscoelastic studies and nanomechanical assessment of a wide range of materials, from soft biological specimens to hard metallic samples.

“The MultiMode® platform has long been the gold standard for performance and application versatility, and we’ve significantly enhanced its capabilities with the MultiMode 8-HR,” commented Stephen Minne, Ph.D., Vice President and General Manager of Bruker’s AFM Business. “Unique improvements include higher speeds, higher resolution imaging, new capabilities in nanomechanics with enhanced PeakForce QNM®, and new FastForce Volume™ modes. In keeping with our ongoing commitment to our thousands of loyal MultiMode customers, we have designed these new developments in resolution, flexibility, and reliability to be available also as upgrades to their current MultiMode systems.”

About MultiMode 8-HR 
The high-resolution and data processing capabilities of the MultiMode 8-HR are the result of its combination of rigid, mechanical design and extremely advanced control electronics. Utilizing Bruker’s NanoScope® V Controller and new Version 8.2 software, the system features unprecedented bandwidth and extremely low-noise data acquisition to enable such proprietary technology advances as ScanAsyst®, Peak Force QNM and FastForce Volume. These features combine to reaffirm the MultiMode 8-HR as the most versatile, highest performance AFM in its class.

About Bruker Corporation
For more than 50 years, Bruker has enabled scientists to make breakthrough discoveries and develop new applications that improve the quality of human life. Bruker’s high-performance scientific research instruments and high-value analytical solutions enable scientists to explore life and materials at molecular, cellular and microscopic levels. In close cooperation with our customers, Bruker is enabling innovation, productivity and customer success in life science molecular research, in applied and pharma applications, in microscopy, nano-analysis and industrial applications, as well as in cell biology, preclinical imaging, clinical research, microbiology and molecular diagnostics.

Media Contact: 
Stephen Hopkins, Marketing Communications
Bruker Nano Surfaces Division
T: +1 (520) 741-1044 x1022
E: steve.hopkins@bruker.com

PORTO, Portugal – April 11, 2016 – At the 7th AFM BioMed Conference, Bruker’s Nano Surfaces Division today announced the release of RampScript™, which provides extensive new scripting capabilities for the BioScope Resolve® BioAFM. BioScope Resolve has set new standards for highest resolution AFM imaging with the first ever images of microvilli on live cells and by routinely resolving submolecular structures, such as the major and minor groove of DNA, while operating on an inverted microscope. With its combination of Bruker’s exclusive PeakForce Tapping® and FASTForce Volume™ technologies, BioScope Resolve already provides the widest range of ramp rates for biomechanics. Adding the most flexible ramp scripting interface available opens the door to new studies probing the dynamics of individual biomolecular bonds and the viscoelasticity of live cells.

“We are excited about the advances in cell mechanobiology that will be enabled by the new ramp scripting capabilities for BioScope Resolve,” said Marco Tortonese, Ph.D., Vice President and General Manager of Bruker’s AFM Instrumentation Business. “Atomic force microscopy can play an even larger role in cell mechanics research when a system has the capability to correlate with the most accurate data to fluorescence. This is why we made it such a priority to add the most comprehensive biomechanics functionality to a system specifically designed for highest resolution on an inverted optical microscope.”

About RampScript 
The RampScript package for BioScope Resolve delivers the most powerful mechanical investigation toolset available today. It complements the system’s widest range of ramp rates and allows users to build, control, and record complex nanomechanical measurements in such experiments as protein pulling, ligand-receptor interaction, and cell mechanics. RampScript features user-definable scripts for custom point measurements with step-by-step ramp definitions and simple drag-and-drop functionality for the ultimate experiment control. Ramps include seamless switching from segment to segment between open- and closed-loop operation, ramping and holding, Z-feedback and force feedback, as well as easy addition of TTL signals to synchronize optical microscopy or other external measurements. Bruker’s RampScript also enables dynamic mechanical analysis with frequency sweeps during ramp and hold measurements, at single points as well as integrated into force volume maps. A specially designed low-force trigger capability, together with fast, latency-free implementation build on the core performance of the BioScope Resolve to provide the most accurate script execution with pN force control.

Media Contact:
Stephen Hopkins, Marketing Communications
Bruker Nano Surfaces Division
T: +1 (520) 741-1044 x1022
E: steve.hopkins@bruker.com

Providing Nanometer-Resolution at High Scan Rates for up to 300-mm Samples

 

Santa Barbara, California – April 25, 2016 – Bruker today announced the release of the Dimension FastScan Pro™ Automated AFM Nano-Metrology System for high-volume measurement environments. FastScan Pro renders performance previously achievable only by AFM experts in research laboratories while delivering the repeatability and reproducibility expected in a production environment. The system integrates Bruker’s proven lowest noise and fast scanning technology to provide the highest throughput without reducing data quality. FastScan Pro also utilizes a highly comprehensive software automation package that features intuitive recipe-writing capabilities to reduce complex measurement routines to simple, push-button operations. This unique industrial AFM solution is completed with Bruker FastScan probes specifically designed to deliver longer tip life and sustained high-resolution data acquisition across hundreds of samples in high-volume environments. With its open access platform, large- or multiple-sample holders, and numerous ease-of-use features, FastScan Pro opens up the power of high-performance, research-grade atomic force microscopy to meet production requirements.

“Bruker has put considerable resources behind moving our unique, highly sophisticated research technologies into production applications,” said Marco Tortonese, Ph.D., Vice President and General Manager of Bruker’s AFM Instrumentation Business. “The FastScan Pro system’s industry-leading ease-of-use, highest resolution performance, greater than ten times measurement throughput increase, and capability to produce over five-hundred data images from a single probe should change the landscape of nanoscale quality control in manufacturing.”

About Dimension FastScan Pro

FastScan Pro incorporates both FastScan and Icon AFM scanners and Bruker-exclusive PeakForce Tapping® technology to perform accurate depth measurements from sub-nanometer steps to high-aspect ratio trenches with high accuracy. Robust software and an intuitive user interface support automated laser and detector alignment. Included is a built-in user-accessible cantilever database for system auto-settings, safe fast-engage control, and easy sample navigation. The system also features new AutoMET software, which delivers fast, automated metrology, exceptional ease-of-use, and AFM adaptability to capture critical-to-quality measurements needed in QA/QC, FA and production.

Media Contact: 
Stephen Hopkins
Marketing Communications
Bruker Nano Surfaces Division
T: +1 (520) 741-1044 x1022
E: steve.hopkins@bruker.com