Providing First and Only AFM Viscoelastic Measurements that Match Bulk DMA

BOSTON, Massachusetts – November 27, 2018 – At the 2018 MRS Fall Meeting & Exhibit, Bruker today announced the release of the AFM-nDMA™ mode for Dimension® atomic force microscopes (AFMs). Going beyond the quantitative elastic modulus mapping enabled by Bruker’s exclusive PeakForce QNM® mode, AFM-nDMA provides first and only nanoscale viscoelastic measurements that match bulk dynamic mechanical analysis (DMA) over the entire frequency range typical in bulk rheological measurements. Enabled by proprietary algorithms, AFM-nDMA works directly at rheological frequencies, quantifies preload and adhesion, and comes with absolute calibration. As a result, AFM-nDMA generates entire master curves of storage modulus, loss modulus, and loss tangent, including analysis for activation energy, thus vastly expanding the AFM market by providing polymer rheology at the nanoscale.

“Bruker’s AFM-nDMA is the first commercial solution for quantifying viscoelasticity at the spatial scales of AFM,” said Dr. Ken Nakajima, Professor of Polymer Physics at Tokyo Institute of Technology. “Having pioneered nanoscale rheological measurements, I am very excited to see this important capability become widely available.”

“We can now quantify local viscoelasticity at relevant frequencies and length scales that relate nanoscale properties to bulk performance,” added Greg Meyers, Ph.D., Dow Chemical Core R&D Fellow. “This addresses a significant unmet need for industrial polymer characterization.”

“AFM-nDMA reflects our long-standing commitment to provide quantitative and easy-to-use nanomechanical characterization,” explained David V. Rossi, Executive Vice President and General Manager of Bruker’s AFM business. “From the invention of TappingModeTM to PeakForce Tapping® and now AFM-nDMA, we have consistently led this charge, and we are very eager to see the use of atomic force microscopy growing with quantitative viscoelastic characterization.”

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October 25, 2018 ─ Bruker has recently introduced new and expanded probe families to address AFM industry needs.

PeakForce Deep Trench

Bruker’s new PeakForce Deep Trench (PFDT) series of probes is engineered to provide accurate depth metrology and imaging on the most challenging structures encountered on semiconductor samples and optics, including trenches and pits with aggressive aspect ratios and depths of more than 100nm.

Specifically designed for Dimension Icon, this probe series leverages PeakForce Tapping technology. PeakForce is well known to be ideal for aggressive geometries, such as deep and narrow trenches, because it avoids the air damping and sticking effects that plague approaches based on resonant modes such as Tapping or non-contact. The cantilever shape, spring constant, and resonance frequency of these probes are highly optimized for PeakForce Tapping, and the spike angle is tilt corrected for Dimension Icon. The result is repeatable, accurate metrology with high throughput and long tip life.

Contact Resonance

Bruker is also introducing a range of probes for contact resonance. All of these probes feature a wear-resistant, conductive diamond coating for highest repeatability and resolution. On a Dimension Icon with FASTForce Volume Contact Resonance, these probes have been shown to provide many dozens of images with no measurable wear or change in nanomechanical values. These probes also employ Bruker’s V2 process for the most consistent tip and cantilever shape, further enhancing measurement consistency.

Adama

We have vastly expanded our offering of Adama Innovations diamond probes. Our range now includes sharp and supersharp apex diamond tips for high resolution electrical applications, intermediate radius cone shape tips with outstanding consistency, wide angle tips for highest load mechanical applications, and high aspect ratio pillar tips for the most challenging geometries. All tips feature strong wear resistance, allowing for constant contact size and resolution during long term measurements.

Featuring PeakForce Tapping for Quantitative Bio-Mechanical Property Mapping

World-Leading Graphene Research Facility Purchases Multiple Bruker AFMs

BILLERICA, Mass. – April 6, 2015 – Bruker Corporation (NASDAQ: BRKR) today announced an official partnership with the University of Manchester’s National Graphene Institute (NGI), joining a select list of industrial collaborators. This partnership follows NGI’s purchase of two additional atomic force microscopes (AFMs) from Bruker, a Dimension FastScan^® and a Dimension Icon^®. These systems join five other Bruker AFMs at the facility for research into the nanofabrication and nanoscale properties of graphene. As part of this partnership, Bruker will partially sponsor a Ph.D. student working on novel scanning probe microscopy (SPM) techniques to characterize graphene and 2D materials.

Graphene, the world’s thinnest, strongest and most conductive material, was first isolated and characterized at The University of Manchester by Sir Andre Geim and Sir Kostya Novoselov, who were awarded the Nobel Prize for Physics in 2010 for their research. This transparent, one-atom thick flat sheet of carbon has the potential to revolutionize technology, from smartphones and ultrafast broadband to drug delivery and computer chips. AFMs have demonstrated spatial resolution of less than a nanometer, and enable scientists developing materials such as graphene to understand critical mechanical, electrical, and chemical properties at the atomic scale.

“Our Bruker AFMs are anticipated to provide important new insights into nanoscale variations of graphene conductivity and work function,” said Nobel Prize winner Professor Novoselov. “Coupled with simultaneous quantitative mapping of mechanical properties, enabled by Bruker’s exclusive PeakForce Tapping^®, NGI researchers hope to uncover new information that will ultimately optimize the performance of graphene-based materials and devices.”

“We are pleased that the National Graphene Institute continues to rely on our proprietary technology for its new world-class research facility, bringing their total now to seven Bruker systems,” added Paul Scagnetti, Ph.D., President of Bruker’s Nano Surfaces Division. He continued: “We are also gratified to be a part of the UK-wide Centre for Doctoral Training, where our unique AFM technologies will enable the sponsored Ph.D. student to learn even more about the physical and electrical properties of 2D materials under Professor Novoselov.”

About the UK National Graphene Institute 
The National Graphene Institute at The University of Manchester, UK, opened in March 2015, creating around 100 new jobs in a new, 7,800 square meter facility that will house state-of-the-art facilities, including two cleanrooms. The Institute will also feature a 1,500 square meter research lab for University of Manchester graphene scientists to collaborate with their colleagues from industry and other universities.

About Bruker Corporation 
For more than 50 years, Bruker has enabled scientists to make breakthrough discoveries and develop new applications that improve the quality of human life. Bruker’s high-performance scientific research instruments and high-value analytical solutions enable scientists to explore life and materials at molecular, cellular and microscopic levels.

In close cooperation with our customers, Bruker is enabling innovation, productivity and customer success in life science molecular research, in applied and pharma applications, in microscopy, nano-analysis and industrial applications, as well as in cell biology, preclinical imaging, clinical research, microbiology and molecular diagnostics.

Media Contact: 
Stephen Hopkins, Marketing Communications
Bruker Nano Surfaces Division
T: +1 (520) 741-1044 x1022
E: steve.hopkins@bruker-nano.com

Investor Contact: 
Joshua Young
Vice President, Investor Relations
T: +1 (978) 663-3660 x1479
E: Joshua.young@bruker.com

Providing Nanometer-Resolution at High Scan Rates for up to 300-mm Samples

Santa Barbara, California – April 25, 2016 – Bruker today announced the release of the Dimension FastScan Pro™ Automated AFM Nano-Metrology System for high-volume measurement environments. FastScan Pro renders performance previously achievable only by AFM experts in research laboratories while delivering the repeatability and reproducibility expected in a production environment. The system integrates Bruker’s proven lowest noise and fast scanning technology to provide the highest throughput without reducing data quality. FastScan Pro also utilizes a highly comprehensive software automation package that features intuitive recipe-writing capabilities to reduce complex measurement routines to simple, push-button operations. This unique industrial AFM solution is completed with Bruker FastScan probes specifically designed to deliver longer tip life and sustained high-resolution data acquisition across hundreds of samples in high-volume environments. With its open access platform, large- or multiple-sample holders, and numerous ease-of-use features, FastScan Pro opens up the power of high-performance, research-grade atomic force microscopy to meet production requirements.

“Bruker has put considerable resources behind moving our unique, highly sophisticated research technologies into production applications,” said Marco Tortonese, Ph.D., Vice President and General Manager of Bruker’s AFM Instrumentation Business. “The FastScan Pro system’s industry-leading ease-of-use, highest resolution performance, greater than ten times measurement throughput increase, and capability to produce over five-hundred data images from a single probe should change the landscape of nanoscale quality control in manufacturing.”

About Dimension FastScan Pro

FastScan Pro incorporates both FastScan and Icon AFM scanners and Bruker-exclusive PeakForce Tapping® technology to perform accurate depth measurements from sub-nanometer steps to high-aspect ratio trenches with high accuracy. Robust software and an intuitive user interface support automated laser and detector alignment. Included is a built-in user-accessible cantilever database for system auto-settings, safe fast-engage control, and easy sample navigation. The system also features new AutoMET software, which delivers fast, automated metrology, exceptional ease-of-use, and AFM adaptability to capture critical-to-quality measurements needed in QA/QC, FA and production.

Media Contact: 
Stephen Hopkins
Marketing Communications
Bruker Nano Surfaces Division
T: +1 (520) 741-1044 x1022
E: steve.hopkins@bruker.com