Sharp Conductive Single Crystal Diamond Probes

Highly conductive Apex Sharp diamond probes, formed by a unique patented process ensure the best possible nanomechanical and electrical performance. These tips are sharper and last longer than any other electrical AFM probe. The conductive diamond coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 – 0.005 Ohm∙cm. Contact resistance is typically 10 kΩ depending on contact radius measured on a silver surface. By using wear-resistant sharp diamond probes the contact size is well characterized and stays constant during mechanical measurements. Quantitative and repeatable measurements for over 24 hours of continuous use have been demonstrated with these probes. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.

Choose among two tip radii and three spring constants to match your application:

– AD-0.5-AS – L=225um, W=50um, k=0.5N.m, f=30kHz, r=10+/-5nm
– AD-2.8-AS – L=225um, W=35um, k=2.8N.m, f=65kHz, r=10+/-5nm
– AD-40-AS – L=225um, W=28um, k=40N.m, f=180kHz, r=10+/-5nm
AD-0.5-SS – L=225um, W=50um, k=0.5N.m, f=30kHz, r<5nm
– AD-2.8-SS – L=225um, W=35um, k=2.8N.m, f=65kHz, r<5nm
– AD-40-SS
– L=225um, W=28um, k=40N.m, f=180kHz, r<5nm

Nanomechanics Probe

These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and can image the indents at high resolution in-situ using the same probe. Each cantilever comes individually characterized with both spring constant and tip radius accurately measured, to enable fully quantitative nanomechanical measurements. Each probe comes with a high-resolution SEM image showing the precise tip shape to enable fully quantitative measurements. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.

·         AD-150-NM – L=125um, W=30um, k=150N/m, f=500kHz, r=10+/-5nm

Introducing Bruker’s New High Resolution PeakForce Tapping Probes for any application, air and fluid!

Bruker AFM Probes presents the world’s first family of probes specifically targeted at delivering the highest resolution images in PeakForce Tapping mode, for any application.  We now offer high resolution PeakForce Tapping probe solutions for:

– Biomolecular lattice imaging (PEAKFORCE-HIRS-F-A)
– Single biomolecule imaging (PEAKFORCE-HIRS-F-B)
– Delicate samples in air and fluid (PEAKFORCE-HIRS-SSB)
– General imaging in air (SCANASYST-AIR-HPI-SS)
– High speed imaging (FASTSCAN-D-SS)

 PEAKFORCE-HIRS-F-A

Delivers highest resolution on molecular lattices.
– k = 0.35 N/m
– f = 165 kHz
– Tip radius = 1 nm
– 10 probes

Lattice structure of Bacteriorhodopsin (bR) taken on an inverted optical microscope with BioScope Resolve.  Inset showing a single particle averaging of the bR trimer.  Green circle showing a single lattice defect.  Blue circle showing the lattice substructures. Z scale 0.6 nm.

 

PEAKFORCE-HIRS-F-B

Delivers highest resolution on single biomolecules.
– k = 0.12 N/m
– f = 100 kHz
– Tip radius = 1 nm
– 10 probes

 
Continuous imaging of the DNA double helix obtained while operating on an inverted optical microscope.  Both the major and minor grooves, 2.2 nm and 1.2 nm respectively, are clearly resolved over the entire DNA strand.  150 nm scan size.  Movie playback speed 9x.

 

PEAKFORCE-HIRS-SSB

Delivers highest resolution on delicate samples in air and fluid.
– k = 0.12 N/m
– f = 100 kHz
– Tip radius = 1 nm
– 10 probes

300 nm image showing carbon nanotubes to be aligned with the crystalline structure of a quartz substrate.  Acquired on a Dimension Icon using PeakForce Tapping, with PEAKFORCE-HIRS-SSB probes.

 

SCANASYST-AIR-HPI-SS

Delivers highest resolution for general imaging in air.
– k = 0.25 N/m
– f = 55 kHz
– Tip radius = 1 nm
– 10 probes

300 nm image resolving sharp ridges on a Nioprobe sample.  Acquired on a Dimension Icon using PeakForce Tapping, with SCANASYST-AIR-HPI-SS probes.

 

FASTSCAN-D-SS

Delivers highest resolution for high speed imaging.
– k = 0.25 N/m
– f = 110 kHz (fluid)
– Tip radius = 1 nm
– 10 probes

2

Bruker AFM Probes presents the world’s first family of probes specifically targeted at delivering the highest resolution on bio-samples.  From individually isolated biomolecules to 2D moecular lattices, Bruker now offers a PeakForce-HiRs fluid probe to suit your high resolution needs.

Delivers highest resolution on molecular lattices.
– k = 0.35 N/m
– Tip radius = 1 nm
– 10 probes

Lattice structure of Bacteriorhodopsin (bR) taken on an inverted optical microscope with BioScope Resolve.  Inset showing a single particle averaging of the bR trimer.  Green circle showing a single lattice defect.  Blue circle showing the lattice substructures. Z scale 0.6 nm.

 

Delivers highest resolution on single biomolecules.
– k = 0.12 N/m
– Tip radius = 1 nm
– 10 probes

 
Continuous imaging of the DNA double helix obtained while operating on an inverted optical microscope.  Both the major and minor grooves, 2.2 nm and 1.2 nm respectively, are clearly resolved over the entire DNA strand.  150 nm scan size.  Movie playback speed 9x.

 

December 9, 2015

Dear Valued Contact,

Thank you for your business and engagement with Bruker this past year. We want to call your attention to some important changes in our email addresses for 2016.

Effective January 1, 2016 Bruker email addresses with extension “@bruker-nano.com” will no longer be active.

Our new email extensions “@bruker.com” are active immediately.

Please make note of these changes in your files and correspondence. We will not be able to receive or respond to emails directed to the old addresses.
Below is a chart to assist in identifying the new email addresses.table2Feel free to contact us with any questions.

Best regards,
Bruker Nano Surfaces

E-dispatch-784.inddBruker Introduces New RTESP/RTESPA Silicon AFM Probes
Industry Standard for TappingMode & Non-Contact Imaging Modes

Bruker AFM Probes has introduced an improved version of its popular MPP Line of AFM probes. Bruker’s new line of RTESP/A high quality premium etched silicon probes complements the TESP-V2 range of probes and sets the industry standard for imaging in TappingMode and non-contact mode in air, as well as for force modulation measurements and contact mode imaging.

The new RTESP/A design provides:
• Rotated probe tip for more symmetrical representation of sample features
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics

Bruker middle

Did you know? Bruker offers free probes sample packs. Speak with a probes expert today to find out which sample pack is right for you.
Phone: +1 (800) 715-8440
Email: afmprobeorders@bruker.com

Bruker Footer

Bruker Nano Surfaces Division
3601 Calle Tecate Suite C
Camarillo, CA 93012, USA
Tel. +1 (805) 388-3326
productinfo@bruker.com
www.brukerafmprobes.com

All Contents ©2015 Bruker Corporation. All Rights Reserved.

Bruker AFM Probes is pleased to announce our latest probes for our Innova-IRIS system for the highest performance Tip Enhanced Raman spectroscopy (TERS).

The new TERS Probe model number TERS-AFM, is an ideal choice for TERS measurements on the most challenging non-conductive samples. It provides the unique combination of reliability for short time to data and high contrast for outstanding chemical identification with a resolution of

TERS-AFM

This probe requires Innova-IRIS system with the TERS Tuning Fork capability. Current IRIS Innova systems can be upgraded to support this requirement.

For more information, contact your local Bruker representative.

Bruker AFM Probes recently introduced three new probes to help AFM researchers get the best characterization information possible during studies that require collection of precise electrical conductivity measurements. These probes enable the highest resolution nanoelectrical measurements while delivering exceptional durability.

ddesp-v2 blog

Two of these are new models are the DDESP-V2 and the DDESP-FM-V2 — conductive-doped and diamond-coated to provide high performance during scanning spreading resistance microscopy (SSRM) and Piezo response force microscopy (PFM), which are used to characterize advanced semiconductor devices, microelectromechanical systems (MEMS), and biosensors. In addition to boosted conductivity, these probes also offer an unrivaled hardness for long life and high-resolution imaging.

The tips of DDESP probes maintain their shape throughout their lifetimes due to their diamond coating. The unsurpassed hardness of diamond keeps the probes sharp and enables the collection of multiple SSRM images using a single probe with no loss of sensitivity or resolution. The outstanding wear resistance and superb conductivity of DDESP probes results in the high performance required for SSRM and C-AFM for studying advanced semiconductor devices, MEMS, and biosensors. In applications such as SSRM on silicon semiconductors where a hard contact between tip and sample is required, we recommend model DDESP-V2; for conductive AFM or when working with softer samples, model DDESP-FM-V2 is recommended.

View the DDESP-V2 and DDESP-FM-V2 data sheet.

Information on the third new electrical probe from Bruker, the conductive platinum silicide probe model SCM-PtSi, can be found in the article here.

For more information, contact your local Bruker representative.

Bruker AFM Probes recently introduced three new probes to help AFM researchers get the best characterization information possible during studies that require collection of precise electrical conductivity measurements. These probes enable the highest resolution nanoelectrical measurements while delivering exceptional durability.

Depletion width of <10 nm resolved reliably with SCM-PtSi probes. Sample courtesy of IMEC.

Depletion width of Sample courtesy of IMEC.

One of these is the new platinum silicide AFM probe, model SCM-PtSi, which is an ideal choice for scanning capacitance microscopy (SCM) measurements on the most advanced semiconductor features. It provides the unique combination of increased hardness for outstanding wear resistance and enhanced conductive properties to provide the highest resolution electrical imaging possible. The probes have proven to deliver consistent performance with a long lifetime. The hardness of the SCM-PtSi tip has been increased substantially, resulting in the tip’s ability to remain sharp through successive SCM imaging without losing sensitivity or resolution, making it ideal for studies of advanced technology node (

Other applications for SCM-PtSi probes include conductivity measurements using C-AFM PeakForce TUNA™, electrical force microscopy (EFM), and other electrical characterization applications.

Information on the other two new electrical probes from Bruker, the conductive doped-diamond probe models DDESP-V2 and DDESP-FM-V2, can be found in the article here.

For more information, contact your local Bruker representative.

OTESPA-R3 New Product

Thursday, 17 April 2014 Comments (0)  

Nano Surfaces DivisionBruker
112 Robin Hill Road
Santa Barbara, CA 93117, USA
Tel. +1 (805) 967-1400
www.bruker.com, www.brukerAFMprobes.com

October 9th, 2013

Dear Valued Bruker AFM Probes Customer,

As part of our ongoing program to improve the quality of our probes we would like to provide you with advanced notification of the replacement of various probe models in our AFM Probes product range.

Models OTESPA, OLTESPA & OSCM-PT will be replaced by OTESPA-R3, OLTESPA-R3 & OSCM-PT-R3. The probes are very similar in design with improvements for ease of use and quality. A summary

comparison chart is attached for your reference. Full specification details can be found on www.brukerAFMprobes.com

Please also note that the wafers versions of these probes OTESPA-W & OLTESPA-W will no longer be available in the new probe type and will be replaced by 38 packs of 10 probes.

Bruker is providing advanced notice to you to ensure a sufficient time for transition to these new probes.  It is anticipated that sales of the current probe mode ls w ill be available until the end of April 2014.  Please consult your local Bruker representative for any questions regarding this policy or email us at probesinfo@bruker-nano.com or any of the other regional email addresses shown below.

Bruker appreciates your business and continuing confidence in our products and technology.  We will continue to support your investment in Bruker AFM’s in the years to come.

Lastly please take time to visit our website, www.brukerAFMprobes.com for the latest information, promotions and announcement concerning AFM probes.

Sincerely,

Your Bruker AFM Probes Sales and Support Team
AFM Business Unit, Bruker Nano, Inc.

USA: probesinfo@bruker-nano.com
Europe: probesinfo.uk@bruker-nano.com
Japan:info-nano@bruker-axs.jp
Asia Pacific: Sales.asia@bruker-nano.com

Attachment (click to expand):

OTESPA-OLTESPA-OSCMPT Info October 2013_Page_2

TESP/A-V2 New Product

Thursday, 17 April 2014 Comments (0)  

BrukerNano Surfaces Division
112 Robin Hill Road
Santa Barbara, CA 93117, USA
Tel. +1 (805) 967-1400
www.bruker.com, www.brukerAFMprobes.com

September 16th, 2013

Dear Valued Bruker AFM Probes Customer,

Bruker is pleased to announce the introduction of our new range of Silicon TESP/TESPA probes.  Models TESP & TESPA will be replaced by TESP-V2 TESPW-V2 & TESPA-V2, TESPAW-V2.  The probes are very similar in design with improvements in quality and tightening of dimensional variation. A summary comparison chart is attached for your reference. Full specification details can be found on www.brukerAFMprobes.com.

Bruker is providing advanced notice to you to ensure a sufficient time for transition to these new probes. It is anticipated that sales of the current probe models will be available until the end of March 2014. When you come to re-order TESP/A probes, please order the new probes.

Bruker appreciates your business and continuing confidence in our products and technology. We will continue to support your investment in Bruker AFM’s in the years to come.

Please consult your local Bruker representative for any questions regarding this policy or email us at probesinfo@bruker-nano.com or at one of the regional contact emails below.

Lastly please take time to visit our website, www.brukerAFMprobes.com for the latest information, promotions and announcement concerning AFM probes.

Your Bruker AFM Probes Team
AFM Business Unit, Bruker Nano, Inc.

USA: Probesinfo@brukernano.com
Europe: probesinfo@bruker-nano.com
Japan: Probeinfo-J@bruker-nano.com
Asia Pacific: info@bruker.com.sg

Attachment (click to expand):

TESPA-V2 pg2