7-18-2014 3-15-38 PM

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Nanomechanical Properties of Cell Surfaces With increasingly rapid advancements in bioresearch, there is a growing need for methods that can accurately quantify and map the molecular interactions of biological samples, both with high-force sensitivity and high spatial resolution. Force-distance (FD) curve-based atomic force microscopy is a valuable tool to simultaneously contour the surface and map the biophysical properties of biological samples at the nanoscale.

In this webinar, we will discuss the use of Bruker’s advanced FD-based technology, PeakForce QNM®, combined with chemically functionalized tips to probe the localization and interactions of chemical and biological sites on single native proteins and on living cells at high-resolution.

First, we’ll demonstrate the ability of the method to quantify and image hydrophobic forces on organic surfaces and on microbial pathogens. Then, using biochemically sensitive tips, we will detect single sensor proteins on yeast cells, locate specific interaction sites on native protein, and image filamentous bacteriophages extruding from living bacteria at unprecedented resolution. Topography and specific adhesion maps then can be analyzed and correlated either by Bruker’s NanoScope® analysis software tool or Matlab statistical software.

Owing to its key capabilities (quantitative mapping, resolution of a few nanometers, and true correlation with topography), this novel biochemically-sensitive imaging technique, based on PeakForce Tapping® technology, is a powerful complement to other advanced AFM modes for quantitative, high-resolution bio-imaging.

7-18-2014 3-12-11 PM

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Real-time control of the peak force of the tip-sample interaction with PeakForce Tapping has led to a fundamental change in atomic force microscopy (AFM), providing quantitative mapping of mechanical properties of soft materials at unprecedented resolution and speed while preserving the tip and sample. Force Volume, PeakForce Tapping and Contact Resonance (CR-AFM) can provide complimentary mechanical property information, covering a wide range of time-scales (seconds to microseconds) and accessing different properties and/or different ranges of properties. For example, PeakForce QNM and Force Volume work well with samples of modulus in the range of kPa up to a few tens of GPa, while CR-AFM can cover the range of a few GPa to hundreds of GPa. In some cases, the techniques can be combined for simultaneous results and improved stability.

In this talk, we will discuss improvements to the contact geometry analysis for CR-AFM with examples on various materials. We will also examine new developments combining CR-AFM with force-controlled modes such as force volume and PeakForce tapping. This provides new insights for contact mechanics and also into the mechanics of contact formation and contact breaking. Finally, we will consider the effect of the time dependence of material properties on all of the measurements.

About Bruker AFM Probes

Thursday, 17 April 2014 Comments (0)  

In this webinar we take a look at the growth of Peak Force Tapping in AFM research and review some of the key publications in a wide range of fields that have made use of Peak Force Tapping. Topics range over material property mapping at the nanoscale in the fields of materials, high resolution imaging, bimolecular and cell biology, batteries, graphene, organic photovoltaic, etc. Attendees will also receive a link where they can download a citation list of key publications that can be imported into popular bibliography management software packages.

When performing an AFM measurement one of the most important decisions made is the selection of the proper probe. This decision can make the difference between groundbreaking results or hours of lost time-to-data. When making a probe selection, one is faced with a cornucopia of options and this decision may feel daunting.

In this webinar, the information and probe knowledge used by AFM experts to select a probe is presented.
This webinar will begin with the role of the probe in an AFM measurement; covering the fundamentals of an AFM probe such as cantilever stiffness and frequency, probe shape and probe material and coatings. This is then followed by an in-depth, application specific presentation of probes for common experiments. Topics covered include probes for high resolution and high speed imaging; biological AFM, electrical AFM, nanomechanical AFM and Tip Enhanced Raman (TERS). Lastly, several methods for probe cleaning will be discussed. The webinar closes with a review of the Bruker AFM Probes website and probe selection guide.

This webinar explains how the AFM probe’s key specifications effect its performance, and determine its suitability for a particular application. With this tutorial you will be able to better select any AFM probe as well as make better decisions on how to optimize your experiment through the probe characteristics. Basic and advanced issues will be addressed in this fun and informative webinar.


The Powerful Diversity of the AFM Probe

This webinar explains how the AFM probe’s key specifications effect its performance and determine its suitability for a particular application.

Learn how to make better decisions on AFM probe selection and how to optimize your experiment through the characteristics of the probe.  Basic and advanced issues will be addressed in this informative and fun webinar.

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. Each presentation offers a unique opportunity for you to interact with one or more of our AFM experts. The broadcast subjects are designed to cover current metrology topics, provide solutions to tough microscopy problems, and offer development ideas for new applications, AFM modes, or techniques.

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Dynamic heating and cooling AFM measurements can be challenging because the temperature changes can induce considerable drift both in position, and force control. Linked here (http://www.youtube.com/user/BrukerNano) is a video showing a high speed imaging dynamic experiment from 60 C to -2 C. Tip scanning greatly simplifies the temperature control, while low system drift makes possible the stability. PeakForce Tapping (rather than tapping), which “re-zeros” the force every interaction, enables the continuous imaging over the entire temperature range.

The sample is Poly(diethylsiloxane) (PDES). Siloxanes have broad application as greases, lubricants, elastomers and resins. PDES is a liquid crystal at Room Temperature. When heated, PDES transitions into a fully liquid state at it’s isotropization temperature of ~ 60 C. Cooling back down, PDES undergoes two mesomorphic transitions:
Liquid — Liquid Crystal (mesomorphic), Liquid Crystal — Solid Crystal (~ -2 C).

AFM imaging can be used to study the film nano-morphology, and its changes at each phase transition.

I have received a number of questions if FastScan (our High Speed AFM) works with ScanAsyst (our Auto-Optimization algorithms). It does – and this video link demonstrates that by showing unattended high speed imaging on a diverse set of challenging samples. (http://www.youtube.com/user/BrukerNano?feature=mhee#p/u/0/7bi2YEgie_k) In the video are several simultaneous views of the experiment showing different elements of the scan, including that no one is “operating” the system, as well as a detail of the scan parameters so you can see them auto-optimize on each sample.

We have put a lot of effort into both of these features and would be interested to hear your comments – particularly if you are an SEM user. At Bruker, and as AFM’ers, we see a lot of advantages of the AFM over SEM, but often hear scientists say the prefer SEM because its faster and easier to use. I hope this video makes them reconsider. . .